SPIE Proceedings [SPIE SPIE Security + Defence - Toulouse, France (Monday 21 September 2015)] Electro-Optical and Infrared Systems: Technology and Applications XII; and Quantum Information Science and Technology - Test and analysis of spectral response for UV image intensifier
Huckridge, David A., Ebert, Reinhard, Gruneisen, Mark T., Dusek, Miloslav, Rarity, John G., Qian, Yunsheng, Liu, Jian, Feng, Cheng, Lv, Yang, Zhang, YijunVolume:
9648
Year:
2015
Language:
english
DOI:
10.1117/12.2194434
File:
PDF, 591 KB
english, 2015