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Abnormal Threshold Voltage Shifts in P-Channel Low-Temperature Polycrystalline Silicon Thin Film Transistors Under Negative Bias Temperature Stress
Kim, Sang Sub, Choi, Pyung Ho, Baek, Do Hyun, Lee, Jae Hyeong, Choi, Byoung DeogVolume:
15
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2015.11167
Date:
October, 2015
File:
PDF, 740 KB
english, 2015