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Effect of 200 MeV Ag12+ ion irradiations on structural, morphological and magnetic properties of HoFe1−xNixO3 (x = 0.0, 0.1, 0.3 and 0.5) thin films grown on Si (100) substrates
Habib, Zubida, Ikram, Mohd., Majid, Kowser, Asokan, K.Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-4195-5
Date:
December, 2015
File:
PDF, 5.08 MB
english, 2015