[IEEE 2015 IEEE MTT-S International Microwave Symposium (IMS2015) - Phoenix, AZ, USA (2015.5.17-2015.5.22)] 2015 IEEE MTT-S International Microwave Symposium - Trap characterization of AlGaN/GaN HEMTs through drain current measurements under pulsed-RF large-signal excitation
Benvegnu, Agostino, Laurent, Sylvain, Meneghini, Matteo, Meneghesso, Gaudenzio, Muraro, Jean-Luc, Barataud, Denis, Zanoni, Enrico, Quere, RaymondYear:
2015
Language:
english
DOI:
10.1109/MWSYM.2015.7166984
File:
PDF, 1.11 MB
english, 2015