SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Microscopic contouring with low coherence interferometry endoscopy
Furlong, Cosme, Gorecki, Christophe, de Groot, Peter J., Novak, Erik L., Buckner, Ben, Heeg, Bauke, Jenkins, Tom, Trolinger, JamesVolume:
9204
Year:
2014
Language:
english
DOI:
10.1117/12.2063870
File:
PDF, 998 KB
english, 2014