Robust high-resolution imaging and quantitative force...

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

Dagdeviren, Omur E, Götzen, Jan, Hölscher, Hendrik, Altman, Eric I, Schwarz, Udo D
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Volume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/6/065703
Date:
February, 2016
File:
PDF, 1.73 MB
english, 2016
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