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Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
Dagdeviren, Omur E, Götzen, Jan, Hölscher, Hendrik, Altman, Eric I, Schwarz, Udo DVolume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/6/065703
Date:
February, 2016
File:
PDF, 1.73 MB
english, 2016