[IEEE 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Rome, Italy (2015.7.27-2015.7.30)] 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Total Ionizing Dose and random dopant fluctuation effects in 65-nm gate length partially depleted Silicon-on-Insulator nMOSFETs
Chatzikyriakou, Eleni, Morgan, Katrina, Ashburn, Peter, Redman-White, William, De Groot, C.H.Year:
2015
Language:
english
DOI:
10.1109/NANO.2015.7388691
File:
PDF, 439 KB
english, 2015