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[IEEE 2015 Portland International Conference on Management of Engineering and Technology (PICMET) - Portland, OR, USA (2015.8.2-2015.8.6)] 2015 Portland International Conference on Management of Engineering and Technology (PICMET) - How to analyze technology life cycle from the perspective of patent characteristics?
Lee, Pei-Chun, Su, Hsin-NingYear:
2015
Language:
english
DOI:
10.1109/PICMET.2015.7273161
File:
PDF, 224 KB
english, 2015