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[IEEE 2015 International Conference on Science and Technology (TICST) - Pathum Thani, Thailand (2015.11.4-2015.11.6)] 2015 International Conference on Science and Technology (TICST) - A finite volume simulation of electrical potential drop in 2D cracked plates
Cheputeh, Ni-asri, Maneeratana, Kuntinee, Kasitvitamnuay, JirapongYear:
2015
DOI:
10.1109/TICST.2015.7369334
File:
PDF, 345 KB
2015