SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Machine Vision Applications in Industrial Inspection XIII - Stereovision-based close-up dimensional inspection
Mitchell, J. Phillip, Spence, Allan D., Capson, David W., Chan, Harley, Goldstein, Marc, Price, Jeffery R., Meriaudeau, FabriceVolume:
5679
Year:
2005
DOI:
10.1117/12.585918
File:
PDF, 800 KB
2005