Boron-Related Defects in Low Temperature Irradiated Silicon
Khirunenko, Ludmila, Sosnin, Mikhail, Duvanskii, Andrei, Abrosimov, N.V., Riemann, HelgeVolume:
242
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.242.285
Date:
October, 2015
File:
PDF, 290 KB
english, 2015