Boron-Related Defects in Low Temperature Irradiated Silicon

Boron-Related Defects in Low Temperature Irradiated Silicon

Khirunenko, Ludmila, Sosnin, Mikhail, Duvanskii, Andrei, Abrosimov, N.V., Riemann, Helge
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Volume:
242
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.242.285
Date:
October, 2015
File:
PDF, 290 KB
english, 2015
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