Noise measurements and fluctuation analysis in nanoparticle films
L.B. Kish, F. Otten, L.K.J. Vandamme, R. Vajtai, C.G. Granqvist, B. Marlow, E. Kruis, H. Fissan, J. Ederth, P. ChaoguangVolume:
11
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s1386-9477(01)00189-8
File:
PDF, 162 KB
english, 2001