SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - 3D profilometry system based on absolute phase calibration
Yu, Hao, Shao, Shuangyun, Zhang, Zhifeng, Feng, Qibo, Fang, Jiancheng, Wang, ZhongyuVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.716744
File:
PDF, 695 KB
english, 2006