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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Infrared Sensors, Devices, and Applications; and Single Photon Imaging II - A parametric analysis of microbolometer pixel designs
Dumas, Matthew J., Lail, Brian A., LeVan, Paul D., Sood, Ashok K., Wijewarnasuriya, Priyalal S., Razeghi, Manijeh, Pau Vizcaíno, Jose Luis, Sudharsanan, Rengarajan, Ulmer, Melville P., Manzur, TariqVolume:
8155
Year:
2011
Language:
english
DOI:
10.1117/12.894170
File:
PDF, 2.64 MB
english, 2011