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Electronic transport properties of single-crystal silicon nanowires fabricated using an atomic force microscope
N Clément, D Tonneau, H Dallaporta, V Bouchiat, D Fraboulet, D Mariole, J Gautier, V SafarovVolume:
13
Year:
2002
Language:
english
Pages:
4
DOI:
10.1016/s1386-9477(02)00288-6
File:
PDF, 191 KB
english, 2002