Two-wave X-ray optical diagnostics of GexSi1−x/Si...

Two-wave X-ray optical diagnostics of GexSi1−x/Si modulation-doped heterostructures

A.G Touryanski, I.V Pirshin, M.A Rzaev, F Schäffler, M Mühlberger
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Volume:
13
Year:
2002
Language:
english
Pages:
3
DOI:
10.1016/s1386-9477(02)00303-x
File:
PDF, 358 KB
english, 2002
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