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Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe deposited on glass substrates
L. Johann, A. Ennaciri, L. Broch, V. Demange, F. Machizaud, J.M. DuboisVolume:
17
Year:
2003
Language:
english
Pages:
2
DOI:
10.1016/s1386-9477(02)00867-6
File:
PDF, 78 KB
english, 2003