Multifrequency spectrum analysis using fully digital G...

Nanotechnology 2016 / 03 Vol. 27; Iss. 10

Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy

Collins, Liam, Belianinov, Alex, Somnath, Suhas, Rodriguez, Brian J, Balke, Nina, Kalinin, Sergei V, Jesse, Stephen
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Volume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/10/105706
Date:
March, 2016
File:
PDF, 1.95 MB
english, 2016
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