[IEEE 2015 IEEE 31st International Conference on Data Engineering (ICDE) - Seoul, South Korea (2015.4.13-2015.4.17)] 2015 IEEE 31st International Conference on Data Engineering - Advanced analytics on SAP HANA: Churn risk scoring using call network analysis
Bracher, Shane, Holmes, Mark, Mischewski, Liam, Islam, Asadul, McClenaghan, Michael, Ricketts, Daniel, Neuber, Glenn, Jeung, Hoyoung, Vijayarajendran, PriyaYear:
2015
Language:
english
DOI:
10.1109/ICDE.2015.7113386
File:
PDF, 1.71 MB
english, 2015