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[IEEE 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2015.6.4-2015.6.5)] 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Polarity dependent radiation hardness of GaN
Matsuo, Masayuki, Murayama, Takayuki, Koike, Kazuto, Sasa, Shigehiko, Yano, Mitsuaki, Gonda, Shun-ichi, Uedono, Akira, Ishigami, Ryoya, Kume, Kyo, Ohtomo, Tomomi, Furukawa, Erika, Yamazaki, Yoshiki, KYear:
2015
Language:
english
DOI:
10.1109/IMFEDK.2015.7158544
File:
PDF, 525 KB
english, 2015