[IEEE 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Buzios, Rio de Janeiro, Brazil (2015.6.3-2015.6.5)] 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty
Kulkarni, Anupama, Patrascu, Mihai, van de Vijver, Yuri, van Wensveen, Jaap, Pijnenburg, Robert, Nihtianov, StoyanYear:
2015
Language:
english
DOI:
10.1109/ISIE.2015.7281460
File:
PDF, 893 KB
english, 2015