[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Connection of the Parametric and Functional Control for TID Testing of Complex VLSI Circuits
Marfin, Vladimir A., Nekrasov, Pavel V., Loskutov, Ilya O.Year:
2015
Language:
english
DOI:
10.1109/RADECS.2015.7365595
File:
PDF, 356 KB
english, 2015