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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Processing: Machine Vision Applications VI - Improved skin detection method by iteratively eliminating pseudo-skin colors through combined skin filter
Kwon, Oh-Yeol, Kim, Kyung-Ah, Chien, Sung-Il, Bingham, Philip R., Lam, Edmund Y.Volume:
8661
Year:
2013
Language:
english
DOI:
10.1117/12.2008482
File:
PDF, 647 KB
english, 2013