Simulation-based optimization of the electrodynamic ion...

Simulation-based optimization of the electrodynamic ion funnel for high sensitivity electrospray ionization mass spectrometry

Aleksey V. Tolmachev, Taeman Kim, Harold R. Udseth, Richard D. Smith, Thomas H. Bailey, Jean H. Futrell
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Volume:
203
Year:
2000
Language:
english
Pages:
17
DOI:
10.1016/s1387-3806(00)00265-7
File:
PDF, 904 KB
english, 2000
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