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Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry
Robert D English, Michael J Van Stipdonk, Emile A SchweikertaVolume:
209
Year:
2001
Language:
english
Pages:
12
DOI:
10.1016/s1387-3806(01)00468-7
File:
PDF, 235 KB
english, 2001