Developing a simple analytical thermal model for discrete semiconductor in operating condition
Bouguezzi, Sihem, Ayadi, Moez, Ghariani, MoezLanguage:
english
Journal:
Applied Thermal Engineering
DOI:
10.1016/j.applthermaleng.2016.02.017
Date:
February, 2016
File:
PDF, 1.55 MB
english, 2016