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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Modeling and analysis of the return path discontinuity caused by vias using the 3-conductor model
Engin, A.E., Coenen, M., Koehne, H., Sommer, G., John, W.Year:
2003
Language:
english
DOI:
10.1109/ICSMC2.2003.1429110
File:
PDF, 788 KB
english, 2003