[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Gated van der Pauw measurements: A powerful tool for probing electron trapping effects in GaN HEMTs
Mehari, Shlomo, Gavrilov, Arkady, Eizenberg, Moshe, Ritter, DanYear:
2015
Language:
english
DOI:
10.1109/DRC.2015.7175587
File:
PDF, 691 KB
english, 2015