Defect depth estimation using pulsed eddy current with...

Insight - Non-Destructive Testing and Condition Monitoring 2009 / 02 Vol. 51; Iss. 2

Defect depth estimation using pulsed eddy current with varied pulse width excitation

Abidin, I Zainal, Mandache, C, Tian, G Y, Li, Yong
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Volume:
51
Language:
english
Journal:
Insight - Non-Destructive Testing and Condition Monitoring
DOI:
10.1784/insi.2009.51.2.69
Date:
February, 2009
File:
PDF, 2.41 MB
english, 2009
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