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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - The influence of target distance to lens distortion variation
Bräuer-Burchardt, Christian, Bosse, Harald, Bodermann, Bernd, Silver, Richard M.Volume:
6617
Year:
2007
Language:
english
DOI:
10.1117/12.726110
File:
PDF, 453 KB
english, 2007