Dynamics of Threshold Voltage Instability in IGZO TFTs:...

  • Main
  • 2016
  • Dynamics of Threshold Voltage Instability in IGZO TFTs:...
IEEE Transactions on Electron Devices 2016

Dynamics of Threshold Voltage Instability in IGZO TFTs: Impact of High Pressurized Oxygen Treatment on the Activation Energy Barrier

Song, Ji Hun, On, Nuri, Anh, Byung Du, Kim, Hye Dong, Jeong, Jae Kyeong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2511883
File:
PDF, 1.10 MB
english, 2016
Conversion to is in progress
Conversion to is failed