A Simulation Study of Carrier Transport Affected by Local...

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IEEE Transactions on Electron Devices 2016

A Simulation Study of Carrier Transport Affected by Local Defects in Amorphous InGaZnO Thin-Film Transistors

Hsu, Chih-Chieh, Chen, Yu-Ting
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2521263
File:
PDF, 1.94 MB
english, 2016
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