Investigations of Porous Silicon with Deposited 3D-Metals by Auger- and Ultrasoft X-Ray Emission Spectroscopy
Domashevskaya, E. P., Lenshin, A. S., Kashkarov, V. M., Shabanova, I. N., Terebova, N. A.Volume:
12
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.6478
Date:
November, 2012
File:
PDF, 905 KB
english, 2012