Effect of Source and Drain Contacts Schottky Barrier on 3C-SiC Nanowire FETs I-V Characteristics
Rogdakis, Konstantinos, Lee, Seoung Yong, Kim, Dong Joo, Lee, Sang Kwon, Bano, Edwige, Zekentes, KonstantinosVolume:
615-617
Year:
2009
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.615-617.235
File:
PDF, 1.13 MB
english, 2009