Semi-conductors faults analysis in dual active bridge DC–DC...

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IET Power Electronics 2016 / 01

Semi-conductors faults analysis in dual active bridge DC–DC converter

Piris-Botalla, Laureano E., Falco, Cristian A., García, Guillermo O., Airabella, Andrés M., Oggier, Germán G.
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Language:
english
Journal:
IET Power Electronics
DOI:
10.1049/iet-pel.2015.0299
Date:
January, 2016
File:
PDF, 895 KB
english, 2016
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