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[IEEE 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Rome, Italy (2015.7.27-2015.7.30)] 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Bidirectional scanning force microscopy probes with co-resonant sensitivity enhancement
Reiche, Christopher F., Korner, Julia, Buchner, Bernd, Muhl, ThomasYear:
2015
Language:
english
DOI:
10.1109/NANO.2015.7388849
File:
PDF, 1.81 MB
english, 2015