A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2015

A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs

Li, Tianjian, Xie, Feng, Liang, Xiaoyao, Xu, Qiang, Chakrabarty, Krishnendu, Jing, Naifeng, Jiang, Li
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2015.2512909
File:
PDF, 8.49 MB
english, 2015
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