SPIE Proceedings [SPIE International Conference on Optical Metrology - Pultusk Castle, Poland (Wednesday 20 October 1999)] Interferometry '99: Techniques and Technologies - Two-wavelength interferometry combined with N-point technique
Schmidt, Joanna, Kujawinska, Malgorzata, Takeda, MitsuoVolume:
3744
Year:
1999
Language:
english
DOI:
10.1117/12.357713
File:
PDF, 364 KB
english, 1999