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[IEEE 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Rome, Italy (2015.7.27-2015.7.30)] 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Aqueous imaging by SEM-CT system inside environmental-SEM
Nakajima, Masahiro, Takeuchi, Masaru, Shimazaki, Kouya, Hisamoto, Naoki, Hasegawa, Yasuhisa, Fukuda, Toshio, Qiang Huang,Year:
2015
DOI:
10.1109/NANO.2015.7388753
File:
PDF, 1.69 MB
2015