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[IEEE 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Rome, Italy (2015.7.27-2015.7.30)] 2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO) - Variability and cycling endurance in nanoscale resistive switching memory

Ielmini, D., Balatti, S., Wang, Z.-Q., Ambrogio, S.
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Year:
2015
Language:
english
DOI:
10.1109/nano.2015.7388864
File:
PDF, 519 KB
english, 2015
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