Performance Improvement of Poly-Si Tunnel FETs by Trap Density Reduction
Ma, William Cheng-Yu, Chen, Yi-HsuanVolume:
63
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2505734
Date:
February, 2016
File:
PDF, 1.13 MB
english, 2016