SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 2 February 2013)] Vertical External Cavity Surface Emitting Lasers (VECSELs) III - TEM based analysis of III-Sb VECSELs on GaAs substrates for improved laser performance.
Ahirwar, P., Shima, D., Rotter, T. J., Clark, S. P. R. .., Addamane, S. J., Hains, C. P., Dawson, L. R., Balakrishnan, G., Bedford, R., Lai, Y. Y., Laurain, A., Hader, J., Moloney, J. V., Hastie, JennVolume:
8606
Year:
2013
Language:
english
DOI:
10.1117/12.2005301
File:
PDF, 855 KB
english, 2013