Tolerating transient illegal turn faults in NoCs
Huang, Letian, Zhang, Xiaofan, Ebrahimi, Masoumeh, Li, GuangjunLanguage:
english
Journal:
Microprocessors and Microsystems
DOI:
10.1016/j.micpro.2016.01.016
Date:
February, 2016
File:
PDF, 5.00 MB
english, 2016