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[IEEE 2014 IEEE 23rd Electrical Performance of Electronic Packaging and Systems (EPEPS) - Portland, OR, USA (2014.10.26-2014.10.29)] 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems - Accuracy tolerance analysis of the multimode TRL de-embedding technique
Yin, Gen, Cai, Xiao-Ding, Secker, David, Ortiz, Matt, Cline, Julia, Vaidyanath, ArunYear:
2014
Language:
english
DOI:
10.1109/EPEPS.2014.7103634
File:
PDF, 676 KB
english, 2014