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[IEEE 2010 International Conference on Machine Learning and Cybernetics (ICMLC) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Machine Learning and Cybernetics - Multiple classifier systems combined with localized generalization error for fault diagnosis of power transformers
Chen, Wei-Chun, Chan, Patrick P. K., Ng, Wing W. Y., Yeung, Daniel S.Year:
2010
Language:
english
DOI:
10.1109/ICMLC.2010.5580838
File:
PDF, 108 KB
english, 2010