SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - A new technique for contact lenses measuring based on digital image processing
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Xu, Qiheng, Liao, Haiyang, Feng, SumaoVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2199207
File:
PDF, 1.60 MB
english, 2015