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Intrinsic I-V and C-V characteristics of ultra-thin oxide MOS (p) and MOS (n) structures under deep depletion
Liao, Yu Ching, Hwu, Jenn GwoVolume:
12
Year:
2015
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/IJNT.2015.066190
File:
PDF, 2.80 MB
english, 2015