[IEEE 2014 IEEE International Microwave and RF Conference (IMaRC) - Bangalore, India (2014.12.15-2014.12.17)] 2014 IEEE International Microwave and RF Conference (IMaRC) - Chipless RFID based high resolution crack sensing through SWB technology
Dey, Shuvashis, Kalansuriya, Prasanna, Karmakar, Nemai ChandraYear:
2014
Language:
english
DOI:
10.1109/IMaRC.2014.7039040
File:
PDF, 679 KB
english, 2014