[IEEE 2004 International Symposium on Electromagnetic...

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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Estimation of source location of leakage field from transformer-type microwave oven

Taira, K., Kato, T., Sawaya, K., Sato, R.
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Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1349844
File:
PDF, 607 KB
english, 2004
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