Measurement of backscattered dose at metallic interfaces using high energy electron beams
Sanjay Sathiyan, M. Ravikumar, Sanjay S. SupeVolume:
11
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/s1507-1367(06)71056-2
File:
PDF, 219 KB
english, 2006